Title :
Observation of single event upsets in analog microcircuits
Author :
Koga, R. ; Pinkerton, S.D. ; Moss, S.C. ; Mayer, D.C. ; LaLumondiere, S. ; Hansel, S.J. ; Crawford, K.B. ; Crain, W.R.
Author_Institution :
Aerospace Corp., Los Angeles, CA, USA
fDate :
12/1/1993 12:00:00 AM
Abstract :
Selected analog devices were tested for heavy-ion-induced single event upset (SEU). The results of these tests are presented, likely upset mechanisms are discussed, and standards for the characterization of analog upsets are suggested. The OP-15 operational amplifier, which was found to be susceptible to SEU in the laboratory, has also experienced upset in space. Possible strategies for mitigating the occurrence of analog SEUs in space are also discussed
Keywords :
MOS integrated circuits; comparators (circuits); integrated circuit testing; ion beam effects; linear integrated circuits; operational amplifiers; radiation hardening (electronics); OP-15 operational amplifier; analog microcircuits; heavy ion induced SEU; single event upsets; space; upset mechanisms; voltage comparator; Aerospace testing; Circuit testing; Extraterrestrial measurements; Laboratories; Operational amplifiers; Pulse amplifiers; Single event transient; Single event upset; System testing; Voltage;
Journal_Title :
Nuclear Science, IEEE Transactions on
