DocumentCode
1041235
Title
Observation of single event upsets in analog microcircuits
Author
Koga, R. ; Pinkerton, S.D. ; Moss, S.C. ; Mayer, D.C. ; LaLumondiere, S. ; Hansel, S.J. ; Crawford, K.B. ; Crain, W.R.
Author_Institution
Aerospace Corp., Los Angeles, CA, USA
Volume
40
Issue
6
fYear
1993
fDate
12/1/1993 12:00:00 AM
Firstpage
1838
Lastpage
1844
Abstract
Selected analog devices were tested for heavy-ion-induced single event upset (SEU). The results of these tests are presented, likely upset mechanisms are discussed, and standards for the characterization of analog upsets are suggested. The OP-15 operational amplifier, which was found to be susceptible to SEU in the laboratory, has also experienced upset in space. Possible strategies for mitigating the occurrence of analog SEUs in space are also discussed
Keywords
MOS integrated circuits; comparators (circuits); integrated circuit testing; ion beam effects; linear integrated circuits; operational amplifiers; radiation hardening (electronics); OP-15 operational amplifier; analog microcircuits; heavy ion induced SEU; single event upsets; space; upset mechanisms; voltage comparator; Aerospace testing; Circuit testing; Extraterrestrial measurements; Laboratories; Operational amplifiers; Pulse amplifiers; Single event transient; Single event upset; System testing; Voltage;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/23.273472
Filename
273472
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