DocumentCode
1041417
Title
Thermal resistance measurement of avalanche diodes
Author
McAvoy, B.R.
Volume
18
Issue
10
fYear
1971
fDate
10/1/1971 12:00:00 AM
Firstpage
973
Lastpage
975
Abstract
A new method of thermal resistance measurement is presented. The variation of diode breakdown voltage with input power as a function of time is the basis of the method. Diode space-charge resistance and series resistance together with separate components of heat-flow resistance are measured using this method. The technique of the measurement is straightforward and provides results with little ambiguity and high accuracy.
Keywords
Atomic measurements; Capacitance; Circuits; Diodes; Electrical resistance measurement; Impurities; Resistance heating; Temperature; Thermal resistance; Voltage;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/T-ED.1971.17312
Filename
1476634
Link To Document