Title :
Comments on "Electronic image storage utilizing a silicon dioxide target"
Author_Institution :
Corning Glass Works, Corning, N. Y.
Abstract :
It is shown that, contrary to the statements in the above paper, the secondary emission yield of thermally grown SiO2does not saturate. Rather, the results reported fall on a yield curve which peaks at a yield of 7.4 at a primary electron energy of 500 eV.
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1971.17314
