• DocumentCode
    1041525
  • Title

    The Design of High Power Vacuum Tubes for Industrial Heating Applications

  • Author

    Doolittle, H.D.

  • Author_Institution
    Machlett Laboratories, Inc., Springdale, Conn.
  • Volume
    70
  • Issue
    2
  • fYear
    1951
  • fDate
    7/1/1951 12:00:00 AM
  • Firstpage
    1934
  • Lastpage
    1937
  • Abstract
    Analysis of tube failures from industrial application has pointed up three principal sources of failure: (1) copper-glass seals are not strong enough to withstand handling by industrial maintenance people; (2) filament structures of the spring-tensioned type are not too reliable; (3) thin-walled copper anodes will not stand occasional overloads. Tubes have been designed which greatly increase tube life by eliminating failures of the above types. The use of thick kovar metal in glass seals will withstand about ten times the torsion of the conventional copper seals commonly used in transmitter tubes. A self-supporting filament structure not only eliminates the failures caused by filaments sticking in guides and annealing of the spring material, but maintains uniform tube characteristics throughout life. Data on a type ML-5658 20-kw tube shows less than 2 per cent change in static data after 10,000 hours of life. The use of copper anodes from four to eight times thicker than customary permits nearly 100 per cent increase in plate dissipation ratings without additional water flow. For use at normal plate dissipation, the anode temperature runs lower and scaling of the anode, with resultant anode puncture, is eliminated. Failure of tubes due to excessive cathode temperature cannot be reduced since evaporation of the cathode material is a physical reality which cannot be compromised. Instead of running a tube above ratings, a larger tube with greater cathode area must be used.
  • Keywords
    Anodes; Cathodes; Copper; Electron tubes; Failure analysis; Heating; Maintenance; Metals industry; Seals; Temperature;
  • fLanguage
    English
  • Journal_Title
    American Institute of Electrical Engineers, Transactions of the
  • Publisher
    ieee
  • ISSN
    0096-3860
  • Type

    jour

  • DOI
    10.1109/T-AIEE.1951.5060653
  • Filename
    5060653