DocumentCode :
1041570
Title :
Study of a CMOS-JFET-bipolar radiation hard analog-digital technology suitable for high energy physics electronics
Author :
Dentan, M. ; Delagnes, E. ; Fourches, N. ; Rouger, M. ; Habrard, M.C. ; Blanquart, L. ; Delpierre, P. ; Potheau, R. ; Truche, R. ; Blanc, J.P. ; Delevoye, E. ; Gautier, J. ; Pelloie, J.L. ; de Pontcharra, J. ; Flament, O. ; Leray, J.L. ; Martin, J.L. ; Mo
Author_Institution :
CEN Saclay, Gir-sur-Yvette, France
Volume :
40
Issue :
6
fYear :
1993
fDate :
12/1/1993 12:00:00 AM
Firstpage :
1555
Lastpage :
1560
Abstract :
The authors present results obtained on a rad-hard mixed analog-digital technology that integrates monolithically complementary MOS (CMOS) transistors, complementary junction FETs (CJFETs), and complementary bipolar transistors (C-bipolars). This technology is expected to satisfy the hard constraints of Large Hadron Collider (LHC) detector electronics. These three families of transistors have been chosen to offer large flexibility of design. MOS and bipolar transistors provide electrical characteristics close to those of modern BiCMOS technologies and will allow the design on the same chip of both analog and digital fast rad-hard circuits. JFET transistors will permit designs of low-noise very rad-hard circuits for room or cryogenic temperature operation. The results show devices with rad-hard performances against neutrons and gamma particles in the range of 1×1014 n/cm2 (1 MeV) and 10 Mrads (SiO2), well suited to LHC detector requirements. JFETs, which have shown a low sensitivity to protons (500 MeV) up to 1×1014, are very rad-hard against ionizing dose as well as displacement damages
Keywords :
gamma-ray effects; mixed analogue-digital integrated circuits; neutron effects; nuclear electronics; proton effects; radiation hardening (electronics); 1 MeV; 10 Mrad; 500 MeV; LHC detector requirements; complementary bipolar transistors; complementary junction FETs; gamma particles; high energy physics electronics; low-noise; mixed analog-digital; monolithically complementary MOS; neutrons; protons; radiation hard analog-digital technology; Analog-digital conversion; Bipolar transistors; CMOS technology; Circuits; Detectors; Electric variables; JFETs; Large Hadron Collider; MOSFETs; Radiation hardening;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/23.273505
Filename :
273505
Link To Document :
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