• DocumentCode
    1041606
  • Title

    Large-signal transient analysis and effects of lateral charge spreading in television camera tubes

  • Author

    Crowell, Clarence R. ; Madden, Richard M.

  • Author_Institution
    University of Southern California, Los Angeles, Calif.
  • Volume
    18
  • Issue
    11
  • fYear
    1971
  • fDate
    11/1/1971 12:00:00 AM
  • Firstpage
    1049
  • Lastpage
    1057
  • Abstract
    The transient response of television camera tubes to changing levels of illumination is examined. When the entire transient occurs within the exponential retarding potential region of the electron beam I-V characteristic and photoconductive lag can be neglected, exact analytical expressions describing the rise and decay of video signal levels are established. The author present separate solutions to the problem based on the assumptions of electron beam scanning and charging by a hypothetical defocused beam (uniform charging case). The results support arguments in favor of target current biasing to minimize lag and turn-on time. We also show the effects of scanning as opposed to continuous dwelling by a flood beam. The decay transient is shown to be universial in the sense that it is independent of the initial signal strength and depends only on physical tube parameters. The validity of the expression describing signal decay is confirmed experimentally for a silicon diode array vidicon and a return beam silicon diode array vidicon. The effect on the resolution of target surface conductivity in conjunction with a finite electron beam impedance is treated for a steady-state per pattern and isolated circular spot illumination. In particular, the strong dependance of resolution, as limited by a conducting target surface, on operating current level is described. Lateral target leakage is shown to offer little advantage in decreasing lag.
  • Keywords
    Cameras; Diodes; Electron beams; Lighting; Photoconductivity; Silicon; Surface treatment; TV; Transient analysis; Transient response;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1971.17330
  • Filename
    1476652