• DocumentCode
    1041770
  • Title

    Influence of slip plane dislocations on electrical performances of N-P-N planar transistors

  • Author

    Conti, Mario ; Corda, G.

  • Author_Institution
    Società Generale Semiconduttori, Milan, Italy.
  • Volume
    18
  • Issue
    12
  • fYear
    1971
  • fDate
    12/1/1971 12:00:00 AM
  • Firstpage
    1148
  • Lastpage
    1150
  • Abstract
    Dislocations have been introduced in a well-controlled way in n-p-n bipolar transistors diffused on ∠111∠ silicon by plastic deformation. Two different geometries have been considered. While the collector current shows the well-known theoretical dependence on emitter-base voltage, the base current is significantly increased and is strongly affected by base surface potential. Low-frequency noise performances are also reported.
  • Keywords
    Bipolar transistors; Etching; Frequency; Furnaces; Geometry; Plastics; Silicon; Stress; Temperature; Voltage;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1971.17346
  • Filename
    1476668