DocumentCode
1041770
Title
Influence of slip plane dislocations on electrical performances of N-P-N planar transistors
Author
Conti, Mario ; Corda, G.
Author_Institution
Società Generale Semiconduttori, Milan, Italy.
Volume
18
Issue
12
fYear
1971
fDate
12/1/1971 12:00:00 AM
Firstpage
1148
Lastpage
1150
Abstract
Dislocations have been introduced in a well-controlled way in n-p-n bipolar transistors diffused on ∠111∠ silicon by plastic deformation. Two different geometries have been considered. While the collector current shows the well-known theoretical dependence on emitter-base voltage, the base current is significantly increased and is strongly affected by base surface potential. Low-frequency noise performances are also reported.
Keywords
Bipolar transistors; Etching; Frequency; Furnaces; Geometry; Plastics; Silicon; Stress; Temperature; Voltage;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/T-ED.1971.17346
Filename
1476668
Link To Document