The effect of finite flux rise time on recording performance

An experimental and theoretical investigation has been made of the effect of finite flux rise time on transition length and delay time for thin recording media. This was done by tracing the field history of particles as they pass the write head and by assuming that the remanent magnetization of each particle depends on the maximum field it experienced. For linear rise times and for separation greater than half a gap width, analytic expressions have been derived showing the dependence of transition length and delay time on rise time and the other recording parameters. Numerical solutions valid for separations down to one quarter of a gap width and including exponential rise times are also shown.