Title :
Design of built-in current sensors for concurrent checking in radiation environments
Author :
Nicolaidis, M. ; Vargas, F. ; Courtois, B.
fDate :
12/1/1993 12:00:00 AM
Abstract :
A technique for concurrently checking faults in static CMOS circuits is proposed. It performs concurrent monitoring of static current by means of built-in current sensors (BICS) and detects the leakage current that accompanies the parametric shifts. Using BICs also allows the selection of high-quality circuits during manufacturing testing, resulting in a higher mean time to failure
Keywords :
CMOS integrated circuits; built-in self test; concurrent engineering; electric current measurement; integrated circuit testing; leakage currents; production testing; radiation effects; built-in current sensors; concurrent checking; high-quality circuits; leakage current; manufacturing testing; mean time to failure; parametric shifts; radiation environments; static CMOS circuits; Circuit faults; Circuit testing; Condition monitoring; Degradation; Electrical fault detection; Fault detection; Fault tolerant systems; Ionizing radiation; Leakage current; Logic;
Journal_Title :
Nuclear Science, IEEE Transactions on
