Title :
The VfTrelation of CW Gunn-effect devices
Author :
Freeman, Kenneth R. ; Hobson, Geoffrey S.
Author_Institution :
University of Sheffield, Sheffield, England
fDate :
1/1/1972 12:00:00 AM
Abstract :
Theoretical device simulations and experimental results are presented to show that the origin of an empirical relationship between the bias voltage and transit frequency of CW longitudinal Gunn-effect devices lies in a combination of space-charge propagation effects and thermal effects. The bias current-voltage relationship is considerably altered by the particular details of the device doping profile through average accumulation or depletion effects, as well as by the temperature.
Keywords :
Circuit simulation; Computational modeling; Diodes; Doping profiles; Feedback; Frequency; Gunn devices; Marine vehicles; Temperature dependence; Voltage;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1972.17372