• DocumentCode
    1042103
  • Title

    Pulse properties of large 50-50 NiFe tape cores

  • Author

    Winter, Stuart D. ; Kuenning, Robert W. ; Berg, Gary G.

  • Author_Institution
    University of California, Livermore, CA
  • Volume
    6
  • Issue
    1
  • fYear
    1970
  • fDate
    3/1/1970 12:00:00 AM
  • Firstpage
    41
  • Lastpage
    45
  • Abstract
    Over 400 cores of 1-mil 50-50 NiFe, each core containing 40 or more pounds of material, are used in a linear induction accelerator, which is a part of a controlled thermonuclear research experiment. Each core couples a constant voltage pulse of approximately 10kV lasting 350 ns to an electron beam whose current is in the hundreds of amperes range. To achieve reasonable operation of the accelerator it is essential that the drive power to the cores, both during the forward pulse and reset, be kept to a minimum. Since cores of this size and constant voltage drives of this magnitude are both rarities, potential manufacturers of these cores have been reluctant to guarantee the pulse performance. To overcome this reluctance a study program consisting of both a theoretical analysis and experimental tests was conducted. Specifically, the purpose of the study was to find answers to three key questions. 1) What is the minimum current required in an optimum core? 2) What are the major contributors to deviations from the minimum current? 3) What can be done to insure consistently good cores? Results of the study for cores made of both 1-mil and 1/2-mil tape are discussed; the major findings being that at these drive levels, eddy currents both within individual wraps and between wraps cause the dominant losses. Recently about 200 such cores were obtained. The measured pulse values are compared with the predicted values.
  • Keywords
    Electron linear accelerators; Iron-nickel alloys; Magnetic cores; Nickel-iron alloys; Capacitors; Electron beams; Inductance; Magnetic cores; Optical coupling; Plasma measurements; Pulse measurements; Pulse shaping methods; Testing; Voltage;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/TMAG.1970.1066693
  • Filename
    1066693