DocumentCode :
104216
Title :
A 3-D Stackable Maskless Embedded Metal-Gate Thin-Film-Transistor Nanowire for Use in Bioelectronic Probing
Author :
Min-Cheng Chen ; Chang-Hsien Lin ; Chia-Yi Lin ; Hsiao-Chain Chen ; Ta-Hsien Lee ; Mu-Yi Hua ; Jian-Tai Qiu ; ChiaHua Ho ; Fu-Liang Yang
Author_Institution :
Nat. Nano Device Labs., Hsinchu, Taiwan
Volume :
61
Issue :
3
fYear :
2014
fDate :
Mar-14
Firstpage :
897
Lastpage :
901
Abstract :
Using a self-aligned sidewall microcrystalline-silicon (μc-Si) dual channel, comprising a sub-50-nm channel width, a novel 3-D stackable maskless embedded metal-gate thin-film-transistor nanowire device was fabricated on top metal using a tungsten gate-stack and trilayered oxide/nitride/oxide gate dielectric. The results of using a charge-transferring mechanism based on the solution-phased pH of a phosphate buffer solution and vascular endothelial growth factor showed that μc-Si surfaces exhibit high potential for use in bioelectronics. The device exhibits long-term reliability regarding bioelectronic probing and is as reliable as the commercially available enzyme-linked immunosorbent assay when conducting a targeted, 100-day therapy for ovarian cancer. Thus, the proposed device exhibits potential for use in label-free, economical, and highly reliable lab-on-chip 3-D applications.
Keywords :
CMOS integrated circuits; biomedical electronics; dielectric materials; elemental semiconductors; nanoelectronics; nanowires; semiconductor device reliability; semiconductor growth; silicon; thin film transistors; three-dimensional integrated circuits; tungsten; 3D stackable maskless embedded metal-gate thin-film-transistor nanowire device; Si; bioelectronic probing; charge-transferring mechanism; enzyme-linked immunosorbent assay; lab-on-chip 3D applications; long-term reliability; ovarian cancer; phosphate buffer solution; self-aligned sidewall microcrystalline-silicon dual channel; solution-phased pH; trilayered oxide-nitride-oxide gate dielectric; tungsten gate-stack; vascular endothelial growth factor; Educational institutions; Logic gates; Nanobioscience; Nanoscale devices; Reliability; Sensitivity; Sensors; Back end of line (BEOL) technology; field-effect transistor (FET); lab on chip; nanosensor fabrication; nanowire semiconductive sensors;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/TED.2014.2298462
Filename :
6740855
Link To Document :
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