• DocumentCode
    1042320
  • Title

    Estimation of threshold stress in accelerated life-testing

  • Author

    Hirose, Hideo

  • Author_Institution
    Takaoka Electric Manuf. Co. Ltd., Aichi, Japan
  • Volume
    42
  • Issue
    4
  • fYear
    1993
  • fDate
    12/1/1993 12:00:00 AM
  • Firstpage
    650
  • Lastpage
    657
  • Abstract
    The author presents a method that uses accelerated life-test data to estimate the mean life at the service stress and the threshold stress below which a failure is unlikely to occur. The relation between stress and mean-life at that stress is assumed to follow an inverse power law that includes a threshold stress. The failure times at a given stress are assumed to follow a Weibull distribution in which the shape parameter varies with the stress. This model extends the well-known Weibull inverse power law model. If only the mean life but not a specific percentile point at a service stress is sought, the maximum likelihood method is useful for parameter estimation. This is a tradeoff in the parametric approach. For adoption of an appropriate probability model, the likelihood ratio test as well as the Akaike Information Criterion are used. Type I right censored data are considered. Extensions of the method are discussed
  • Keywords
    failure analysis; life testing; maximum likelihood estimation; parameter estimation; probability; reliability theory; Akaike Information Criterion; Weibull distribution; accelerated life-testing; failure times; inverse power law; likelihood ratio test; maximum likelihood method; mean-life; parameter estimation; parametric approach; probability model; service stress; shape parameter variation; threshold stress estimation; type I right censored data; Acceleration; Dielectrics and electrical insulation; Failure analysis; Gas insulation; Inverse problems; Life estimation; Maximum likelihood estimation; Positron emission tomography; Power transformer insulation; Thermal stresses;
  • fLanguage
    English
  • Journal_Title
    Reliability, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9529
  • Type

    jour

  • DOI
    10.1109/24.273601
  • Filename
    273601