DocumentCode
1042481
Title
Threshold voltages of normally off MESFET´s
Author
Jutzi, Wilhelm ; Reiser, Martin
Author_Institution
IBM Zurich Research Laboratory, Rüschlikon, Switzerland
Volume
19
Issue
3
fYear
1972
fDate
3/1/1972 12:00:00 AM
Firstpage
314
Lastpage
322
Abstract
The threshold voltage of "normally off" Si-MESFET\´s for simple dc-coupled circuits is defined and computed with a two-dimensional device model, taking into account carrier velocity saturation and diffusion. The influence of the main parameters, gate length, conducting-layer thickness, and doping is investigated outside the range of Shockley\´s equations. A threshold voltage of a MESFET with a 1-µm gate length
V±10 percent requires a conducting-layer thickness tolerance
µm±3 percent.
V±10 percent requires a conducting-layer thickness tolerance
µm±3 percent.Keywords
Doping; Electrodes; Electron mobility; Equations; FETs; Insulation; MESFET circuits; Semiconductor process modeling; Substrates; Threshold voltage;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/T-ED.1972.17420
Filename
1476891
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