• DocumentCode
    1042481
  • Title

    Threshold voltages of normally off MESFET´s

  • Author

    Jutzi, Wilhelm ; Reiser, Martin

  • Author_Institution
    IBM Zurich Research Laboratory, Rüschlikon, Switzerland
  • Volume
    19
  • Issue
    3
  • fYear
    1972
  • fDate
    3/1/1972 12:00:00 AM
  • Firstpage
    314
  • Lastpage
    322
  • Abstract
    The threshold voltage of "normally off" Si-MESFET\´s for simple dc-coupled circuits is defined and computed with a two-dimensional device model, taking into account carrier velocity saturation and diffusion. The influence of the main parameters, gate length, conducting-layer thickness, and doping is investigated outside the range of Shockley\´s equations. A threshold voltage of a MESFET with a 1-µm gate length U_{T} = 0.2 V±10 percent requires a conducting-layer thickness tolerance d =0.15 µm±3 percent.
  • Keywords
    Doping; Electrodes; Electron mobility; Equations; FETs; Insulation; MESFET circuits; Semiconductor process modeling; Substrates; Threshold voltage;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1972.17420
  • Filename
    1476891