DocumentCode
1042565
Title
The Effects of Drain-Bias on the Threshold Voltage Instability in Organic TFTs
Author
Zan, Hsiao-Wen ; Kao, Shin-Chin
Author_Institution
Dept. of Photonics & Display Inst., Nat. Chiao Tung Univ., Hsinchu
Volume
29
Issue
2
fYear
2008
Firstpage
155
Lastpage
157
Abstract
In this letter, the influence of drain bias on the threshold voltage instability in pentacene-based organic thin-film transistors (OTFTs) was studied. By applying different drain biases to adjust the channel carrier concentration in linear mode, the threshold voltage shift was found to be proportional to the carrier concentration. The experimental data can be well quantitatively explained by the drain bias-stress theory developed for a-Si TFTs. The outcome gives the insight of the degradation mechanism of OTFTs and is important for the design of OTFT pixel circuit, OTFT analog amplifiers, or OTFT active loads.
Keywords
carrier density; electric potential; organic compounds; thin film transistors; active loads; analog amplifiers; channel carrier concentration; drain-bias; organic TFTs; pentacene; pixel circuit; thin-film transistors; threshold voltage instability; Dielectric substrates; Gold; Low voltage; Organic semiconductors; Organic thin film transistors; Pentacene; Thermal degradation; Thin film circuits; Thin film transistors; Threshold voltage; Bias-stress effect; organic thin-film transistor (OTFT); pentacene; reliability;
fLanguage
English
Journal_Title
Electron Device Letters, IEEE
Publisher
ieee
ISSN
0741-3106
Type
jour
DOI
10.1109/LED.2007.914081
Filename
4435986
Link To Document