• DocumentCode
    1042565
  • Title

    The Effects of Drain-Bias on the Threshold Voltage Instability in Organic TFTs

  • Author

    Zan, Hsiao-Wen ; Kao, Shin-Chin

  • Author_Institution
    Dept. of Photonics & Display Inst., Nat. Chiao Tung Univ., Hsinchu
  • Volume
    29
  • Issue
    2
  • fYear
    2008
  • Firstpage
    155
  • Lastpage
    157
  • Abstract
    In this letter, the influence of drain bias on the threshold voltage instability in pentacene-based organic thin-film transistors (OTFTs) was studied. By applying different drain biases to adjust the channel carrier concentration in linear mode, the threshold voltage shift was found to be proportional to the carrier concentration. The experimental data can be well quantitatively explained by the drain bias-stress theory developed for a-Si TFTs. The outcome gives the insight of the degradation mechanism of OTFTs and is important for the design of OTFT pixel circuit, OTFT analog amplifiers, or OTFT active loads.
  • Keywords
    carrier density; electric potential; organic compounds; thin film transistors; active loads; analog amplifiers; channel carrier concentration; drain-bias; organic TFTs; pentacene; pixel circuit; thin-film transistors; threshold voltage instability; Dielectric substrates; Gold; Low voltage; Organic semiconductors; Organic thin film transistors; Pentacene; Thermal degradation; Thin film circuits; Thin film transistors; Threshold voltage; Bias-stress effect; organic thin-film transistor (OTFT); pentacene; reliability;
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/LED.2007.914081
  • Filename
    4435986