DocumentCode :
1042677
Title :
Failure Mechanisms Associated With Lens Shape of High-Power LED Modules in Aging Test
Author :
Hsu, Yi-Cheng ; Lin, Yu-Kuan ; Chen, Ming-Hung ; Tsai, Chun-Chin ; Kuang, Jao-Hwa ; Huang, Sheng-Bang ; Hu, Hung-Lieh ; Su, Yeh-I ; Cheng, Wood-Hi
Author_Institution :
Nat. Pingtung Univ. of Sci. & Technol., Pingtung
Volume :
55
Issue :
2
fYear :
2008
Firstpage :
689
Lastpage :
694
Abstract :
High-power light-emitting diode (LED) modules encapsulated with different lens shapes after a thermal-aging test were studied experimentally and numerically. Samples from different manufacturers were aged at 80degC, 100degC, and 120degC under a constant driving voltage of 3.2 V. The results showed that the LED modules encapsulated with a hemispherical-shaped plastic lens exhibited a better lifetime due to better thermal dissipation than those with cylindrical-or elliptical-shaped plastic lenses. Results also showed that the optical power of the LED modules increased after removing the plastic lens because degradation of the lens material decreased the amount of light. The key module package-related failure modes under thermal-aging were identified as the degradation of the plastic lens and lens material. A finite-element method (FEM) simulation showed that thermal and major principle stress distributions of the high-power LED modules were dependent on aging temperature. Both experimental and FEM simulated results clearly indicated that a uniformly thermal dissipation to minimize the thermal effect along the thermal path from the LED chip to the plastic lens is essential to extend the operating life of high-power LED modules.
Keywords :
ageing; failure analysis; finite element analysis; lenses; life testing; light emitting diodes; optical materials; stress analysis; thermal analysis; FEM simulation; finite-element method; hemispherical-shaped plastic lens; high-power LED modules; light-emitting diode; optical power; package-related failure modes; stress distributions; temperature 100 C; temperature 120 C; temperature 80 C; thermal aging test; thermal dissipation; voltage 3.2 V; Aging; Failure analysis; Lenses; Light emitting diodes; Optical materials; Plastics; Shape; Testing; Thermal degradation; Thermal lensing; Aging test; high-power LED module; lens shape;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/TED.2007.911905
Filename :
4435998
Link To Document :
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