• DocumentCode
    1042803
  • Title

    Effect of post-reflow no-clean solder paste residue on electrical performance

  • Author

    Beikmohamadi, Allan

  • Author_Institution
    DuPont Electron., Research Triangle Park, NC, USA
  • Volume
    16
  • Issue
    8
  • fYear
    1993
  • fDate
    12/1/1993 12:00:00 AM
  • Firstpage
    799
  • Lastpage
    801
  • Abstract
    An experiment was conducted to examine the effect of postreflow no-clean solder paste residue of near-end and far-end signal crosstalk due to changes in dielectric constant and leakage resistance in the circuit environment. Additionally, the effect of different frequency levels on postreflow residue was examined. The results suggest that postreflow residues affect the signal-to-noise ratio on circuit boards, depending on the chemistry, residue level, and dielectric properties of these pastes. Higher levels of residues may cause signal degradation on the transmission lines. The noise level on circuit boards increases significantly if a solder paste exhibits excessive residue. Increased crosstalk is believed to be caused by an increase in the dielectric constant (excessive postreflow residues) between two transmission lines. The effect of postreflow residue on circuit performances was more noticeable at frequencies greater than 1 MHz
  • Keywords
    crosstalk; permittivity; printed circuit manufacture; printed circuit testing; soldering; surface treatment; 1 MHz; PCB fabrication; SNR; circuit boards; circuit environment; dielectric constant; electrical performance; leakage resistance; noise level; post-reflow no-clean solder paste residue; postreflow residues; signal crosstalk; signal degradation; signal-to-noise ratio; transmission lines; Chemistry; Crosstalk; Degradation; Dielectric constant; Distributed parameter circuits; Electric resistance; Frequency; Noise level; Printed circuits; Signal to noise ratio;
  • fLanguage
    English
  • Journal_Title
    Components, Hybrids, and Manufacturing Technology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0148-6411
  • Type

    jour

  • DOI
    10.1109/33.273677
  • Filename
    273677