• DocumentCode
    1042942
  • Title

    Paper-tape-controlled electron probe resist exposure and direct metallic deposition

  • Author

    Dix, Christopher ; Ballantyne, J. Peter ; Nixon, William C.

  • Author_Institution
    Cambridge University, Cambridge, England
  • Volume
    19
  • Issue
    5
  • fYear
    1972
  • fDate
    5/1/1972 12:00:00 AM
  • Firstpage
    641
  • Lastpage
    646
  • Abstract
    Computer-aided design techniques are now used extensively for the production of masks in the microelectronic industries. In these methods the microcircuit patterns are broken down into simpler component parts, such as rectangles, whose co-ordinates are punched onto paper tape. A logic system has been developed to control an electron probe from coordinates read in on paper tape. Successive rectangles specified on the tape are scanned by the probe on the specimen, exposing an electron-sensitive material. A microcircuit pattern is thus built up from these basic rectangular elements. The use of an electron probe allows the generation of patterns with submicron dimensions within a reasonable time. The system outlined above has been used to produce microcircuit patterns using two techniques. In one, electron-sensitive resist is used to define a pattern etched in underlying material; in the other, metallic patterns are deposited directly by the decomposition of a metallic compound.
  • Keywords
    Computer industry; Control systems; Design automation; Electrical equipment industry; Electrons; Logic; Microelectronics; Probes; Production; Resists;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1972.17466
  • Filename
    1476937