DocumentCode :
1042986
Title :
TWT delay lines—Part I: Signal propagation on a multivelocity electron beam
Author :
Briggs, Richard J. ; Harris, Neville W.
Author_Institution :
Massachusetts Institute of Technology, Cambridge, Mass.
Volume :
19
Issue :
5
fYear :
1972
fDate :
5/1/1972 12:00:00 AM
Firstpage :
661
Lastpage :
665
Abstract :
An electronically variable microwave delay line uses an extended low-velocity drift region between the input and output helices in a TWT configuration. In this paper, theoretical limits on the maximum delay obtainable from such delay lines are calculated. For a given velocity dispersion, the insertion loss is predicted to rise sharply to prohibitively high values at a critical electron-drift velocity. This sets a practical upper limit to the delay obtainable from such devices; detailed calculations of this maximum delay as a function of the beam parameters (size, current, shape, velocity distribution) are presented. Important factors in the generation of velocity dispersion in the beam and experimental results are discussed in a companion paper [7].
Keywords :
Cathodes; Delay lines; Electron beams; Electron tubes; Insertion loss; Lenses; Microwave propagation; Optical coupling; Propagation delay; Voltage;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/T-ED.1972.17470
Filename :
1476941
Link To Document :
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