• DocumentCode
    1042986
  • Title

    TWT delay lines—Part I: Signal propagation on a multivelocity electron beam

  • Author

    Briggs, Richard J. ; Harris, Neville W.

  • Author_Institution
    Massachusetts Institute of Technology, Cambridge, Mass.
  • Volume
    19
  • Issue
    5
  • fYear
    1972
  • fDate
    5/1/1972 12:00:00 AM
  • Firstpage
    661
  • Lastpage
    665
  • Abstract
    An electronically variable microwave delay line uses an extended low-velocity drift region between the input and output helices in a TWT configuration. In this paper, theoretical limits on the maximum delay obtainable from such delay lines are calculated. For a given velocity dispersion, the insertion loss is predicted to rise sharply to prohibitively high values at a critical electron-drift velocity. This sets a practical upper limit to the delay obtainable from such devices; detailed calculations of this maximum delay as a function of the beam parameters (size, current, shape, velocity distribution) are presented. Important factors in the generation of velocity dispersion in the beam and experimental results are discussed in a companion paper [7].
  • Keywords
    Cathodes; Delay lines; Electron beams; Electron tubes; Insertion loss; Lenses; Microwave propagation; Optical coupling; Propagation delay; Voltage;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1972.17470
  • Filename
    1476941