DocumentCode
1042986
Title
TWT delay lines—Part I: Signal propagation on a multivelocity electron beam
Author
Briggs, Richard J. ; Harris, Neville W.
Author_Institution
Massachusetts Institute of Technology, Cambridge, Mass.
Volume
19
Issue
5
fYear
1972
fDate
5/1/1972 12:00:00 AM
Firstpage
661
Lastpage
665
Abstract
An electronically variable microwave delay line uses an extended low-velocity drift region between the input and output helices in a TWT configuration. In this paper, theoretical limits on the maximum delay obtainable from such delay lines are calculated. For a given velocity dispersion, the insertion loss is predicted to rise sharply to prohibitively high values at a critical electron-drift velocity. This sets a practical upper limit to the delay obtainable from such devices; detailed calculations of this maximum delay as a function of the beam parameters (size, current, shape, velocity distribution) are presented. Important factors in the generation of velocity dispersion in the beam and experimental results are discussed in a companion paper [7].
Keywords
Cathodes; Delay lines; Electron beams; Electron tubes; Insertion loss; Lenses; Microwave propagation; Optical coupling; Propagation delay; Voltage;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/T-ED.1972.17470
Filename
1476941
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