• DocumentCode
    1043051
  • Title

    Measurement of emitter and collector series resistances

  • Author

    Giacoletto, L.J.

  • Author_Institution
    Michigan State University, East Lansing, Mich.
  • Volume
    19
  • Issue
    5
  • fYear
    1972
  • fDate
    5/1/1972 12:00:00 AM
  • Firstpage
    692
  • Lastpage
    693
  • Abstract
    Emitter and collector series (extrinsic) resistances can be evaluated by measuring the open-circuited (floating) junction voltage as the other junction is forward biased. Evaluation can be carried out on either a point-by-point basis or with the aid of a curve tracer. Specific results are indicated for a 2N4400 transistor and an experimental transistor.
  • Keywords
    Circuits; Current measurement; Electrical resistance measurement; Oscilloscopes; Performance evaluation; Silicon; Sparks; Switches; Telephony; Voltage;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1972.17476
  • Filename
    1476947