DocumentCode
1043148
Title
The distribution of gains in uniformly multiplying avalanche photodiodes: Theory
Author
Mcintyre, Robert J.
Author_Institution
RCA Ltd., Ste. Annede-Bellevue, P. Q., Canada
Volume
19
Issue
6
fYear
1972
fDate
6/1/1972 12:00:00 AM
Firstpage
703
Lastpage
713
Abstract
Expressions are derived for the probability
that a pulse initiated by
electrons (or holes) in a uniformly multiplying semiconductor diode will result in a total number of electrons (or holes)
, to give a gain
, and for the probability
that the gain will be
or greater. It is shown that the distributions are far from Gaussian. The gain distribution
for a single photoelectron, for example, is shown to have a maximum value for
for any value of the average gain
. The derivations are valid for any electric field distribution and assume only that the hole ionization coefficient
) can be approximated by the relation
, where
is the electron ionization coefficient and
is a constant. A method of determining an effective value of
, for cases where
is not a good approximation, is presented. The results can be used to calculate the average gain and the mean square deviation from the average, giving results in agreement with previously published relations [1], [2]. The implications of this theory on the use of avalanche diodes for low-level photodetection are discussed. It is shown that in the near infrared, cooled avalanche photodiodes can compare favorably with the best available photomultiplier when used either in a photon-counting mode, or for the reliable detection of low-level laser pulses.
that a pulse initiated by
electrons (or holes) in a uniformly multiplying semiconductor diode will result in a total number of electrons (or holes)
, to give a gain
, and for the probability
that the gain will be
or greater. It is shown that the distributions are far from Gaussian. The gain distribution
for a single photoelectron, for example, is shown to have a maximum value for
for any value of the average gain
. The derivations are valid for any electric field distribution and assume only that the hole ionization coefficient
) can be approximated by the relation
, where
is the electron ionization coefficient and
is a constant. A method of determining an effective value of
, for cases where
is not a good approximation, is presented. The results can be used to calculate the average gain and the mean square deviation from the average, giving results in agreement with previously published relations [1], [2]. The implications of this theory on the use of avalanche diodes for low-level photodetection are discussed. It is shown that in the near infrared, cooled avalanche photodiodes can compare favorably with the best available photomultiplier when used either in a photon-counting mode, or for the reliable detection of low-level laser pulses.Keywords
Avalanche photodiodes; Charge carrier processes; Electrons; Ionization; Laser modes; Laser noise; Low-frequency noise; Photomultipliers; Semiconductor device noise; Semiconductor diodes;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/T-ED.1972.17485
Filename
1476956
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