DocumentCode
1043158
Title
The distribution of gains in uniformly multiplying avalanche photodiodes: Experimental
Author
Conradi, Jan
Author_Institution
RCA Ltd., Ste. Annede-Bellevue, P. Q., Canada,
Volume
19
Issue
6
fYear
1972
fDate
6/1/1972 12:00:00 AM
Firstpage
713
Lastpage
718
Abstract
Experimental measurements of the gain distribution and noise spectral density of silicon avalanche photodiodes are presented and compared with McIntyre´s theories [7], [8]. Excellent agreement is obtained using keff , the effective ratio of the hole and electron ionization coefficients, as the only adjustable parameter.
Keywords
Avalanche photodiodes; Charge carrier processes; Density measurement; Fluctuations; Gain measurement; Ionization; Noise measurement; P-i-n diodes; Signal to noise ratio; Silicon;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/T-ED.1972.17486
Filename
1476957
Link To Document