DocumentCode
1043310
Title
A tight upper bound on the Bayesian probability of error
Author
Hashlamoun, W.A. ; Varshney, P.K. ; Samarasooriya, V.N.S.
Author_Institution
Dept. of Electr. Eng., Birzeit Univ., Israel
Volume
16
Issue
2
fYear
1994
fDate
2/1/1994 12:00:00 AM
Firstpage
220
Lastpage
224
Abstract
In this paper, we present a new upper bound on the minimum probability of error of Bayesian decision systems for statistical pattern recognition. This new bound is continuous everywhere and is shown to be tighter than several existing bounds such as the Bhattacharyya and the Bayesian bounds. Numerical results are also presented
Keywords
Bayes methods; decision theory; pattern recognition; probability; Bayesian probability; minimum error probability; statistical pattern recognition; tight upper bound; Bayesian methods; Computer errors; Laboratories; Machine intelligence; Pattern recognition; Performance analysis; Probability; System performance; Testing; Upper bound;
fLanguage
English
Journal_Title
Pattern Analysis and Machine Intelligence, IEEE Transactions on
Publisher
ieee
ISSN
0162-8828
Type
jour
DOI
10.1109/34.273728
Filename
273728
Link To Document