• DocumentCode
    104358
  • Title

    Evaluation of Encapsulation Materials for High-Temperature Power Device Packaging

  • Author

    Locatelli, M.-L. ; Khazaka, Rami ; Diaham, S. ; Cong-Duc Pham ; Bechara, M. ; Dinculescu, Sorin ; Bidan, Pierre

  • Author_Institution
    LAPLACE, Univ. de Toulouse, Toulouse, France
  • Volume
    29
  • Issue
    5
  • fYear
    2014
  • fDate
    May-14
  • Firstpage
    2281
  • Lastpage
    2288
  • Abstract
    High-temperature power electronics represent an increasing demand. Higher power density or severe ambient temperature applications become the trend, while silicon carbide components with 250-300 °C Tjmax are emerging. Among materials used in high-voltage power module, soft encapsulants play a significant role in improving both semiconductor die and module package voltage ratings, especially under enhanced electrical and thermal constraints. In operation close to their upper temperature limit, two silicone materials were selected among the most thermally stable soft insulators available today. Up to 300 °C, dielectric properties and their stability under isothermal aging in air ambient tests were characterized. The gel, tested using sandwich structures, exhibits cracking of its exposed-to-air face, at an aging temperature as low as 250 °C after less than 100 h. The elastomer, tested as free films, presents no cracking, no degraded electrical characteristics, and a 6 % relative mass loss, after 500 h aging. Moreover, the elastomer insulating properties, at low and high electric field, remains stable up to 300 °C (short-term tests), contrary to the gel which shows a strong increase in dc electrical conductivity. So the elastomer shows promising properties for improved encapsulation performance at 250 °C, to be further investigated in package configurations.
  • Keywords
    gels; power semiconductor devices; semiconductor device packaging; silicone insulation; air ambient tests; dielectric properties; elastomer insulator; encapsulation material; gel insulator; high temperature power device packaging; high voltage power module; isothermal aging; sandwich structure; silicone material; soft encapsulants; temperature 200 C; temperature 300 C; thermally stable soft insulator; Dielectrics; Electrodes; Frequency measurement; Materials; Temperature distribution; Temperature measurement; Dielectric measurements; elastomer; encapsulation; packaging; power semiconductor devices; silicone gel;
  • fLanguage
    English
  • Journal_Title
    Power Electronics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0885-8993
  • Type

    jour

  • DOI
    10.1109/TPEL.2013.2279997
  • Filename
    6587813