مرکز منطقه ای اطلاع رساني علوم و فناوري

DocumentCode :

1044399

Title :

VLSI Testing

Author :

Williams, T.W.

Author_Institution :

IBM Boulder

Volume :

Issue :

fYear :

1984

Firstpage :

126

Lastpage :

136

Keywords :

Design for testability; Fault detection; Logic testing; Performance evaluation; Power engineering and energy; Semiconductor device modeling; Test pattern generators; Very large scale integration;

fLanguage :

English

Journal_Title :

Computer

Publisher :

ieee

ISSN :

0018-9162

Type :

jour

DOI :

10.1109/MC.1984.1658965

Filename :

1658965

Link To Document :

https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1044399