• DocumentCode
    1044516
  • Title

    Reversible thermal breakdown as a switching mechanism in chalcogenide glasses

  • Author

    Warren, Anthony C.

  • Author_Institution
    PA Technology and Science Centre, Cambridge, England
  • Volume
    20
  • Issue
    2
  • fYear
    1973
  • fDate
    2/1/1973 12:00:00 AM
  • Firstpage
    123
  • Lastpage
    131
  • Abstract
    A review of the main features of chalcogenide glass switches is given and interpreted in terms of a thermal runaway mechanism. It is shown that a simple one-dimensional theory is insufficient for describing thin films, and several developments are discussed, including field-dependent effects, channeling instabilities, and electrode hot spots. Suggestions for future work, both theoretical and experimental, that may help to discriminate between thermal and electronic mechanisms are made.
  • Keywords
    Amorphous materials; Delay effects; Electric breakdown; Electrodes; Glass; Resistance heating; Space technology; Switches; Thermal conductivity; Transistors;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1973.17618
  • Filename
    1477275