DocumentCode
1044516
Title
Reversible thermal breakdown as a switching mechanism in chalcogenide glasses
Author
Warren, Anthony C.
Author_Institution
PA Technology and Science Centre, Cambridge, England
Volume
20
Issue
2
fYear
1973
fDate
2/1/1973 12:00:00 AM
Firstpage
123
Lastpage
131
Abstract
A review of the main features of chalcogenide glass switches is given and interpreted in terms of a thermal runaway mechanism. It is shown that a simple one-dimensional theory is insufficient for describing thin films, and several developments are discussed, including field-dependent effects, channeling instabilities, and electrode hot spots. Suggestions for future work, both theoretical and experimental, that may help to discriminate between thermal and electronic mechanisms are made.
Keywords
Amorphous materials; Delay effects; Electric breakdown; Electrodes; Glass; Resistance heating; Space technology; Switches; Thermal conductivity; Transistors;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/T-ED.1973.17618
Filename
1477275
Link To Document