DocumentCode :
1044560
Title :
Assessment of Thermomechanical Damage of Electronic Parts Due to Solder Dipping as a Postmanufacturing Process
Author :
Sengupta, Shirsho ; Das, Diganta ; Ganesan, Sanka ; Rollins, William ; Pinsky, David ; Lin, T.Y. ; Pecht, Michael G.
Author_Institution :
Univ. of Maryland, College Park
Volume :
30
Issue :
2
fYear :
2007
fDate :
4/1/2007 12:00:00 AM
Firstpage :
128
Lastpage :
137
Abstract :
Tin whiskering is a concern with tin-rich alloy finishes on electronic part terminations. Solder dipping may be used to replace the original finish with eutectic tin-lead solder for tin-whiskering risk mitigation purposes. However, the solder dipping process may expose electronic parts to thermomechanical damage within the package due to the thermal refinishing profile used during dipping. This paper discusses solder dipping as a refinishing technique and the associated risks from thermomechanical damage. An experimental study was used to assess the possibility of thermomechanical damage on various electronic part-types of different package configurations. Package and die geometries were characterized for all part-types to develop quantitative metrics, which may be used by electronic part users to assess parts for their susceptibility to thermomechanical damage.
Keywords :
solders; thermomechanical treatment; die geometries; eutectic tin-lead solder; post manufacturing process; solder dipping; thermal refinishing profile; thermomechanical damage; tin-whiskering risk mitigation purposes; Electronic equipment; Electronic packaging thermal management; Environmentally friendly manufacturing techniques; Lead; Legislation; Mechanical engineering; Packaging machines; Process control; Thermomechanical processes; Tin; Component reliability; delamination; restriction of the use of certain hazardous substances in electrical and electronic equipment (RoHS) exemption; solder dipping; tin whisker;
fLanguage :
English
Journal_Title :
Electronics Packaging Manufacturing, IEEE Transactions on
Publisher :
ieee
ISSN :
1521-334X
Type :
jour
DOI :
10.1109/TEPM.2007.899127
Filename :
4265771
Link To Document :
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