• DocumentCode
    1044571
  • Title

    Non-Gaussian Statistical Timing Analysis Using Second-Order Polynomial Fitting

  • Author

    Cheng, Lerong ; Xiong, Jinjun ; He, Lei

  • Author_Institution
    Dept. of Electr. Eng., Univ. of California at Los Angeles, Los Angeles, CA
  • Volume
    28
  • Issue
    1
  • fYear
    2009
  • Firstpage
    130
  • Lastpage
    140
  • Abstract
    For nanometer manufacturing, process variation causes significant uncertainty for circuit performance verification. Statistical static timing analysis (SSTA) is thus developed to estimate timing distribution under process variation. Most existing SSTA techniques have difficulty in handling the non-Gaussian variation distribution and nonlinear dependence of delay on variation sources. To address this problem, we first propose a new method to approximate the max operation of two non-Gaussian random variables through second-order polynomial fitting. With such approximation, we then present new non-Gaussian SSTA algorithms for three delay models: quadratic model, quadratic model without crossing terms (semiquadratic model), and linear model. All the atomic operations (max and sum) of our algorithms are performed by closed-form formulas; hence, they scale well for large designs. Experimental results show that compared to the Monte Carlo simulation, our approach predicts the mean, standard deviation, skewness, and 95% percentile point within 1%, 1%, 6%, and 1% error, respectively.
  • Keywords
    Monte Carlo methods; network analysis; polynomial approximation; statistical analysis; timing; Monte Carlo simulation; circuit performance verification; nanometer manufacturing; nonGaussian random variables; nonGaussian statistical timing analysis; nonGaussian variation distribution; process variation; second-order polynomial fitting; timing distribution; Algorithm design and analysis; Approximation algorithms; Circuit optimization; Delay; Fitting; Manufacturing processes; Polynomials; Random variables; Timing; Uncertainty; Spatial correlation; statistical static timing analysis (SSTA); timing analysis; yield modeling;
  • fLanguage
    English
  • Journal_Title
    Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0278-0070
  • Type

    jour

  • DOI
    10.1109/TCAD.2008.2009143
  • Filename
    4723641