DocumentCode :
1044814
Title :
Fabrication of a nanophotonic quantum dot waveguide and photodetector integrated device
Author :
Huang, L. ; Hegg, M.C. ; Wang, C-J. ; Lin, L.Y.
Author_Institution :
Dept. of Phys., Univ. of Washington, Seattle, WA
Volume :
2
Issue :
4
fYear :
2007
fDate :
12/1/2007 12:00:00 AM
Firstpage :
103
Lastpage :
106
Abstract :
The authors present the design and fabrication of a nanophotonic waveguide and photodetector integrated device by molecular self-assembly of nanocrystal quantum dots (QD) and two different nano-gap formation techniques, namely electromigration-induced break-junction technique and electron beam lithography nano-gap patterning. A QD waveguide with ^50 nm width integrated with a nano-scale QD photodetector is achieved. A comparison is made between the two nano-gap techniques. In addition, a method to achieve high alignment accuracy for nanophotonic integration is discussed.
Keywords :
electromigration; electron beam lithography; integrated optics; nanoelectronics; optical waveguides; optoelectronic devices; photodetectors; quantum dots; self-assembly; electromigration-induced break-junction technique; electron beam lithography; molecular self-assembly; nano-gap formation; nanocrystal quantum dots; nanophotonic integration; nanophotonic quantum dot waveguide; photodetector integrated device;
fLanguage :
English
Journal_Title :
Micro & Nano Letters, IET
Publisher :
iet
ISSN :
1750-0443
Type :
jour
DOI :
10.1049/mnl:20070053
Filename :
4436218
Link To Document :
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