DocumentCode
1044863
Title
A computer-controlled test facility for film memory arrays
Author
Woodruff, W.H.
Author_Institution
IBM Corporation, Burlington, VT, USA
Volume
6
Issue
3
fYear
1970
fDate
9/1/1970 12:00:00 AM
Firstpage
579
Lastpage
580
Keywords
Computer-aided testing; Magnetic film memories; Automatic control; Automatic testing; Clamps; Coils; Computer aided manufacturing; Creep; Instruments; Logic testing; Test facilities; Wire;
fLanguage
English
Journal_Title
Magnetics, IEEE Transactions on
Publisher
ieee
ISSN
0018-9464
Type
jour
DOI
10.1109/TMAG.1970.1066940
Filename
1066940
Link To Document