Title :
Carrier concentration from MIS C-V measurements
fDate :
3/1/1973 12:00:00 AM
Abstract :
By means of a graphical method the bulk carrier concentration can be deduced from the minimum normalized capacitance of a MIS structure with an arbitrary semiconductor, insulator, and insulator thickness.
Keywords :
Amplitude modulation; Capacitance-voltage characteristics; Frequency; Insulation; Laboratories; Liquid crystal displays; Liquid crystals; Optical modulation; Pulse modulation; Voltage;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1973.17650
