DocumentCode :
1044888
Title :
An Internally-Matched High-Isolation CMOS SPDT Switch Using Leakage Cancellation Technique
Author :
Chang, Shuen-Chien ; Chang, Sheng-Fuh ; Chih, Ting-Yueh ; Tao, Jian-An
Author_Institution :
Nat. Chung Cheng Univ., Chiayi
Volume :
17
Issue :
7
fYear :
2007
fDate :
7/1/2007 12:00:00 AM
Firstpage :
525
Lastpage :
527
Abstract :
An internally-matched single-pole double-throw (SPDT) switch with high isolation is presented. The high isolation is resulted from the leakage cancellation by employing a compensation circuit, which also achieves impedance match for all ports. The SPDT chip, implemented in a 0.18-mum CMOS process, achieves a measured isolation of 72 dB, an insertion loss of 1.1 dB, return losses better than 10 dB at all ports and PidB of 19.3 dBm at 1.9 GHz.
Keywords :
CMOS integrated circuits; leakage currents; microwave switches; CMOS SPDT switch; compensation circuit; frequency 1.9 GHz; leakage cancellation technique; loss 1.1 dB; single-pole double-throw switch; size 0.18 mum; CMOS technology; Impedance; Insertion loss; MOSFETs; Radio frequency; Switches; Switching circuits; Topology; Ultra wideband technology; Wireless LAN; CMOS; internally-matched; isolation; switch;
fLanguage :
English
Journal_Title :
Microwave and Wireless Components Letters, IEEE
Publisher :
ieee
ISSN :
1531-1309
Type :
jour
DOI :
10.1109/LMWC.2007.899317
Filename :
4266830
Link To Document :
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