Estimation of Roughness-Induced Power Absorption From Measured Surface Profile Data

Author

Gu, Xiaoxiong ; Tsang, Leung ; Braunisch, Henning

Author_Institution

Washington Univ., Seattle

Volume

17

Issue

7

fYear

2007

fDate

7/1/2007 12:00:00 AM

Firstpage

486

Lastpage

488

Abstract

We present a methodology for extracting the 2D power spectral density of a statistically isotropic random rough surface from height measurements by utilizing fast Fourier-Bessel transform. We compute the additional propagation loss due to surface roughness by integrating the extracted spectral density via the formula of absorption enhancement factor. Results for a microstrip demonstrate good correlation between measured and estimated loss up to 20 GHz. It is also possible to choose a random rough surface model for the measured surface and use it to predict the roughness effect on power loss.

Keywords

Bessel functions; electromagnetic wave absorption; fast Fourier transforms; microstrip lines; rough surfaces; surface roughness; waveguides; 2D power spectral density; absorption enhancement factor; fast Fourier-Bessel transform; height measurements; microstrip; power loss; propagation loss; roughness-induced power absorption; statistically isotropic random rough surface; surface profile data; surface roughness; Absorption; Data mining; Density measurement; Fast Fourier transforms; Loss measurement; Microstrip; Power measurement; Propagation losses; Rough surfaces; Surface roughness; Power absorption; power spectral density (PSD); rough surfaces;

fLanguage

English

Journal_Title

Microwave and Wireless Components Letters, IEEE

Publisher

ieee

ISSN

1531-1309

Type

jour

DOI

10.1109/LMWC.2006.899296

Filename

4266838