DocumentCode
1045005
Title
Technology for monolithic high-power integrated circuits using polycrystalline Si for collector and isolation walls
Author
Kobayashi, Isamu
Author_Institution
Sony Corporation Research Center, Yokohama, Japan
Volume
20
Issue
4
fYear
1973
fDate
4/1/1973 12:00:00 AM
Firstpage
399
Lastpage
404
Abstract
The fabrication technology for a high-power monolithic IC improved the breakdown characteristics and the output current capability. The maximum output power increased to 50 W and the supplied voltage of 110 V was realized. Highly doped polycrystalline Si was used as the collector walls and the isolation walls of transistors. Electrical and physical properties of the polycrystalline structure used in the power IC and the fabrication technology are also described.
Keywords
Amorphous materials; Conductivity; Crystallization; Fabrication; Integrated circuit technology; Isolation technology; Monolithic integrated circuits; Power generation; Substrates; Voltage;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/T-ED.1973.17662
Filename
1477319
Link To Document