• DocumentCode
    1045005
  • Title

    Technology for monolithic high-power integrated circuits using polycrystalline Si for collector and isolation walls

  • Author

    Kobayashi, Isamu

  • Author_Institution
    Sony Corporation Research Center, Yokohama, Japan
  • Volume
    20
  • Issue
    4
  • fYear
    1973
  • fDate
    4/1/1973 12:00:00 AM
  • Firstpage
    399
  • Lastpage
    404
  • Abstract
    The fabrication technology for a high-power monolithic IC improved the breakdown characteristics and the output current capability. The maximum output power increased to 50 W and the supplied voltage of 110 V was realized. Highly doped polycrystalline Si was used as the collector walls and the isolation walls of transistors. Electrical and physical properties of the polycrystalline structure used in the power IC and the fabrication technology are also described.
  • Keywords
    Amorphous materials; Conductivity; Crystallization; Fabrication; Integrated circuit technology; Isolation technology; Monolithic integrated circuits; Power generation; Substrates; Voltage;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1973.17662
  • Filename
    1477319