DocumentCode :
1045005
Title :
Technology for monolithic high-power integrated circuits using polycrystalline Si for collector and isolation walls
Author :
Kobayashi, Isamu
Author_Institution :
Sony Corporation Research Center, Yokohama, Japan
Volume :
20
Issue :
4
fYear :
1973
fDate :
4/1/1973 12:00:00 AM
Firstpage :
399
Lastpage :
404
Abstract :
The fabrication technology for a high-power monolithic IC improved the breakdown characteristics and the output current capability. The maximum output power increased to 50 W and the supplied voltage of 110 V was realized. Highly doped polycrystalline Si was used as the collector walls and the isolation walls of transistors. Electrical and physical properties of the polycrystalline structure used in the power IC and the fabrication technology are also described.
Keywords :
Amorphous materials; Conductivity; Crystallization; Fabrication; Integrated circuit technology; Isolation technology; Monolithic integrated circuits; Power generation; Substrates; Voltage;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/T-ED.1973.17662
Filename :
1477319
Link To Document :
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