Title :
Spectral density of noise generated in charge transfer devices
Author :
Thornber, K.K. ; Tompsett, M.F.
Author_Institution :
Bell Telephone Laboratories, Inc., Murray Hill, N. J.
fDate :
4/1/1973 12:00:00 AM
Abstract :
We calculate the spectral density of the noise added to an analog signal passed through a charge transfer device (CTD) in terms of the charge fluctuation associated with each transfer. A correlation between noise in neighboring elements substantially suppresses the energy content of the noise associated with charge transfer for frequencies much less than the clock frequency.
Keywords :
Charge coupled devices; Charge transfer; Clocks; Fluctuations; Frequency; Leakage current; Low-frequency noise; Noise generators; Phase noise; Presses;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1973.17669
