Title :
Temperature stability of ferrite substrates in microwave integrated circuits
Author_Institution :
Electronic Components Laboratory U.S. Army Electronics Commands, Fort Monmouth, N.J.
fDate :
9/1/1970 12:00:00 AM
Keywords :
Circuit stability; Dielectric constant; Dielectric measurements; Dielectric substrates; Ferrites; Magnetic resonance; Microwave integrated circuits; Microwave measurements; Slabs; Temperature;
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.1970.1066964
