• DocumentCode
    1045154
  • Title

    Transistor performance in intense magnetic fields

  • Author

    Hudson, W.R. ; Meyn, E.H. ; Schultz, C.W.

  • Author_Institution
    NASA Lewis Research Center, Cleveland, Ohio
  • Volume
    6
  • Issue
    3
  • fYear
    1970
  • fDate
    9/1/1970 12:00:00 AM
  • Firstpage
    704
  • Lastpage
    704
  • Abstract
    The forward current transfer ratio h_{FE} = I_{collector}/I_{base} of a germanium bipolar transistor is reduced by the application of a magnetic field. This reduction is greatest when the magnetic vector is perpendicular to the direction of the minority carrier motion through the base region. Electronic instruments which are operated in a strong magnetic field will be adversely affected.
  • Keywords
    Magnetic field effects; Semiconducting devices; Bipolar transistors; Degradation; Fluctuations; Germanium alloys; Instruments; Iron; Magnetic fields; Magnetic noise; Magnetic separation; P-n junctions;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/TMAG.1970.1066965
  • Filename
    1066965