Title :
Characteristics of a depletion-type IGFET
Author_Institution :
Honeywell, Inc., Plymouth, Minn.
fDate :
5/1/1973 12:00:00 AM
Abstract :
Recently, the depletion-type IGFET became widely used as a load device in logic circuits. The purpose of this correspondence is to present a development of the current-voltage characteristic of a depletion-type IGFET based on the assumption that the non-linear semiconductor capacitance can be replaced by a constant average capacitance. This approximation is justified in light of the theoretical and experimental results obtained by many authors [1]-[4], indicating that the exact form of the semiconductor capacitance has little effect on the dc characteristics of a field-effect device.
Keywords :
Capacitance; Current-voltage characteristics; Geometry; Insulation; Logic circuits; Pixel; Semiconductor device doping; Semiconductor process modeling; Solid modeling; Voltage;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1973.17687