DocumentCode
1045276
Title
Characteristics of a depletion-type IGFET
Author
Huang, J.S.T.
Author_Institution
Honeywell, Inc., Plymouth, Minn.
Volume
20
Issue
5
fYear
1973
fDate
5/1/1973 12:00:00 AM
Firstpage
513
Lastpage
514
Abstract
Recently, the depletion-type IGFET became widely used as a load device in logic circuits. The purpose of this correspondence is to present a development of the current-voltage characteristic of a depletion-type IGFET based on the assumption that the non-linear semiconductor capacitance can be replaced by a constant average capacitance. This approximation is justified in light of the theoretical and experimental results obtained by many authors [1]-[4], indicating that the exact form of the semiconductor capacitance has little effect on the dc characteristics of a field-effect device.
Keywords
Capacitance; Current-voltage characteristics; Geometry; Insulation; Logic circuits; Pixel; Semiconductor device doping; Semiconductor process modeling; Solid modeling; Voltage;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/T-ED.1973.17687
Filename
1477344
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