• DocumentCode
    1045276
  • Title

    Characteristics of a depletion-type IGFET

  • Author

    Huang, J.S.T.

  • Author_Institution
    Honeywell, Inc., Plymouth, Minn.
  • Volume
    20
  • Issue
    5
  • fYear
    1973
  • fDate
    5/1/1973 12:00:00 AM
  • Firstpage
    513
  • Lastpage
    514
  • Abstract
    Recently, the depletion-type IGFET became widely used as a load device in logic circuits. The purpose of this correspondence is to present a development of the current-voltage characteristic of a depletion-type IGFET based on the assumption that the non-linear semiconductor capacitance can be replaced by a constant average capacitance. This approximation is justified in light of the theoretical and experimental results obtained by many authors [1]-[4], indicating that the exact form of the semiconductor capacitance has little effect on the dc characteristics of a field-effect device.
  • Keywords
    Capacitance; Current-voltage characteristics; Geometry; Insulation; Logic circuits; Pixel; Semiconductor device doping; Semiconductor process modeling; Solid modeling; Voltage;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1973.17687
  • Filename
    1477344