• DocumentCode
    1045309
  • Title

    Electron microscopy on high-coercive-force Co-Cr composite films

  • Author

    Daval, Jacques ; Randet, Denis

  • Author_Institution
    Centre d´´Etude Nucleaires de Grenoble, Grenoble, France.
  • Volume
    6
  • Issue
    4
  • fYear
    1970
  • fDate
    12/1/1970 12:00:00 AM
  • Firstpage
    768
  • Lastpage
    773
  • Abstract
    Electron microscopy was used to analyze the crystallographic and magnetic structures of high-coercive-force Co-Cr composite films. The chromium sublayer appears to give high coercive forces by causing the growth of cobalt in the hexagonal phase with a relatively narrow distribution of grain sizes. Magnetization reversal was examined by Lorentz microscopy of films with coercive fields up to H_{c} = 900 Oe. It proceeds by nucleation and extension of magnetostatically coupled domains. The progressive limitation of these extensions as the coercive force increases illustrates the connection between the magnetostatic coupling, the coercive force, and the squareness of the hysteresis loop. Lorentz microscopy was also used to investigate a recorded transition between NRZ 1 and 0 states and showed a saw-toothed structure, characteristic of a magnetization in the plane of the film.
  • Keywords
    Chromium-cobalt films; Electron microscopy; Chromium; Coercive force; Couplings; Crystallography; Electron microscopy; Magnetic analysis; Magnetic domains; Magnetic films; Magnetic force microscopy; Magnetostatics;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/TMAG.1970.1066979
  • Filename
    1066979