Title :
Angular Dependence of Single Event Sensitivity in Hardened Flip/Flop Designs
Author :
Baze, M.P. ; Hughlock, Barrie ; Wert, J. ; Tostenrude, Joe ; Massengill, Lloyd ; Amusan, Oluwole ; Lacoe, Ronald ; Lilja, Klas ; Johnson, Mike
Author_Institution :
Boeing Phantom Works, Seattle, WA
Abstract :
SEU data on 90 nm structures displays a strong dependence on incident angle. A right parallelepiped (RPP) approximation is clearly not applicable to the observed response. This paper presents the data, possible mechanisms, and implications for testing and error rate predictions.
Keywords :
flip-flops; angular dependence; error rate predictions; hardened flip-flop designs; right parallelepiped approximation; single event sensitivity; Azimuth; CMOS technology; Flip-flops; Implants; Laboratories; Rails; Single event upset; Testing; Topology; Variable structure systems; Dual interlocked storage cell (DICE); flip-flop; linear energy transfer (LET); propagation; single event upset (SEU);
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2008.2009115
