• DocumentCode
    1045387
  • Title

    Charge-based current model for CMOS gates

  • Author

    Wang, Jessie Hui ; Fan, J.T. ; Fen, W.S.

  • Author_Institution
    Nat. Taiwan Univ., Taipei, Taiwan
  • Volume
    29
  • Issue
    15
  • fYear
    1993
  • fDate
    7/22/1993 12:00:00 AM
  • Firstpage
    1343
  • Lastpage
    1345
  • Abstract
    A charge-based current model is introduced for the first time, which includes the current waveforms induced by non-active events. Time-domain current waveforms can be obtained and the results show good agreement with SPICE. Three error values, DC, Max I, and Max T, differ by no more than 10% from SPICE.
  • Keywords
    CMOS integrated circuits; integrated logic circuits; logic gates; semiconductor device models; CMOS gates; Charge-based current model; current waveforms; error values; non-active events;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19930900
  • Filename
    274843
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1045387