Title :
Single-Event Effect Mitigation in Switched-Capacitor Comparator Designs
Author :
Olson, Brian D. ; Holman, W. Timothy ; Massengill, Lloyd W. ; Bhuva, Bharat L. ; Fleming, Patrick R.
Author_Institution :
Electr. Eng. & Comput. Sci. Dept., Vanderbilt Univ., Nashville, TN
Abstract :
A radiation-hardened-by-design (RHBD) technique is described for reducing errors due to single-event effects at the floating input nodes of a switched-capacitor comparator. The technique is shown to significantly outperform the alternative ldquobrute forcerdquo design choice of increasing capacitor size.
Keywords :
CMOS digital integrated circuits; comparators (circuits); CMOS; brute force design; radiation-hardened-by-design technique; single-event effect mitigation; switched-capacitor comparator designs; Circuit simulation; Circuit testing; Circuit topology; Clocks; Latches; Network topology; Power dissipation; Redundancy; Switched capacitor circuits; Voltage; Comparator; RHBD; radiation-hardened-by-design; single-event; switched-capacitor circuits;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2008.2006895
