Title :
Reliability: Fallacy or Reality?
Author :
Gonzalez, Adriana ; Mahlke, Scott ; Mukherjee, Shubu ; Sendag, Resit ; Chiou, Derek ; Yi, Joshua J.
Author_Institution :
Univ. Polytech. de Catalunya, Barcelona
Abstract :
As chip architects and manufacturers plumb ever-smaller process technologies, new species of faults are compromising device reliability, following an introduction by the authors debate whether reliability is a legitimate concern for the microarchitect. topics include the costs of adding reliability versus those of ignoring it, how to measure it, techniques for improving it, and whether consumers really want it.
Keywords :
integrated circuit reliability; chip architects; chip manufacturers; device reliability; microarchitect; Circuit faults; Costs; Delay; Electrical fault detection; Electromigration; Fault detection; Manufacturing processes; Semiconductor device measurement; Temperature; Voltage; and fault-tolerance; arithmetic and logic structures; control structure reliability; control structures and microprogramming; hardware; memory structures; performance and reliability; reliability; testing;
Journal_Title :
Micro, IEEE
DOI :
10.1109/MM.2007.107