DocumentCode :
1045506
Title :
Reliability: Fallacy or Reality?
Author :
Gonzalez, Adriana ; Mahlke, Scott ; Mukherjee, Shubu ; Sendag, Resit ; Chiou, Derek ; Yi, Joshua J.
Author_Institution :
Univ. Polytech. de Catalunya, Barcelona
Volume :
27
Issue :
6
fYear :
2007
Firstpage :
36
Lastpage :
45
Abstract :
As chip architects and manufacturers plumb ever-smaller process technologies, new species of faults are compromising device reliability, following an introduction by the authors debate whether reliability is a legitimate concern for the microarchitect. topics include the costs of adding reliability versus those of ignoring it, how to measure it, techniques for improving it, and whether consumers really want it.
Keywords :
integrated circuit reliability; chip architects; chip manufacturers; device reliability; microarchitect; Circuit faults; Costs; Delay; Electrical fault detection; Electromigration; Fault detection; Manufacturing processes; Semiconductor device measurement; Temperature; Voltage; and fault-tolerance; arithmetic and logic structures; control structure reliability; control structures and microprogramming; hardware; memory structures; performance and reliability; reliability; testing;
fLanguage :
English
Journal_Title :
Micro, IEEE
Publisher :
ieee
ISSN :
0272-1732
Type :
jour
DOI :
10.1109/MM.2007.107
Filename :
4437718
Link To Document :
بازگشت