Title :
Investigation of Single-Event Transients in Linear Voltage Regulators
Author :
Irom, Farokh ; Miyahira, Tetsuo F. ; Adell, Philippe C. ; Laird, Jamie S. ; Conder, Brandon ; Pouget, Vincent ; Essely, Fabien
Author_Institution :
Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA
Abstract :
Single-event transients (SETs) from heavy ions and laser beam are investigated for two positive adjustable linear voltage regulators: the RH117 from linear technology and the HS-117RH from Intersil. Both positive and negative going transients are observed. The role of input voltage, load capacitance and supply current on the SET response is discussed.
Keywords :
laser beam effects; transient analysis; voltage regulators; HS-117RH; laser beam; linear technology; linear voltage regulators; load capacitance; negative going transients; positive going transient; single-event transient response; Analog integrated circuits; Application specific integrated circuits; Circuit testing; Ion beams; Laboratories; Laser beams; Propulsion; Protons; Regulators; Voltage; Laser; radiation testing; single-event transient; voltage regulator;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2008.2007800
