• DocumentCode
    1045767
  • Title

    Integrating Circuit Level Simulation and Monte-Carlo Radiation Transport Code for Single Event Upset Analysis in SEU Hardened Circuitry

  • Author

    Warren, Kevin M. ; Sternberg, Andrew L. ; Weller, Robert A. ; Baze, Mark P. ; Massengill, Lloyd W. ; Reed, Robert A. ; Mendenhall, Marcus H. ; Schrimpf, Ronald D.

  • Author_Institution
    Inst. for Space & Defense Electron., Vanderbilt Univ., Nashville, TN
  • Volume
    55
  • Issue
    6
  • fYear
    2008
  • Firstpage
    2886
  • Lastpage
    2894
  • Abstract
    Monte-Carlo radiation transport code is coupled with SPICE circuit level simulation to identify regions of single event upset vulnerability in an SEU hardened flip-flop, as well as predict single event upset cross sections and on-orbit soft error rates under static and dynamic operating conditions.
  • Keywords
    Monte Carlo methods; flip-flops; Monte-Carlo radiation transport code; SEU hardened circuitry; SPICE circuit level simulation; circuit level simulation integration; flip-flop; on-orbit soft error rates; single event upset analysis; Analytical models; Circuit simulation; Coupling circuits; Discrete event simulation; Error analysis; Flip-flops; Predictive models; Radiation hardening; SPICE; Single event upset; Geant4; MRED; SEU; SPICE; rate prediction;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.2008.2006481
  • Filename
    4723766
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1045767