Title :
Integrating Circuit Level Simulation and Monte-Carlo Radiation Transport Code for Single Event Upset Analysis in SEU Hardened Circuitry
Author :
Warren, Kevin M. ; Sternberg, Andrew L. ; Weller, Robert A. ; Baze, Mark P. ; Massengill, Lloyd W. ; Reed, Robert A. ; Mendenhall, Marcus H. ; Schrimpf, Ronald D.
Author_Institution :
Inst. for Space & Defense Electron., Vanderbilt Univ., Nashville, TN
Abstract :
Monte-Carlo radiation transport code is coupled with SPICE circuit level simulation to identify regions of single event upset vulnerability in an SEU hardened flip-flop, as well as predict single event upset cross sections and on-orbit soft error rates under static and dynamic operating conditions.
Keywords :
Monte Carlo methods; flip-flops; Monte-Carlo radiation transport code; SEU hardened circuitry; SPICE circuit level simulation; circuit level simulation integration; flip-flop; on-orbit soft error rates; single event upset analysis; Analytical models; Circuit simulation; Coupling circuits; Discrete event simulation; Error analysis; Flip-flops; Predictive models; Radiation hardening; SPICE; Single event upset; Geant4; MRED; SEU; SPICE; rate prediction;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2008.2006481
