DocumentCode
1045806
Title
Design considerations of low-noise high-efficiency silicon IMPATT diodes
Author
Su, Shih-Tang ; Sze, Simon M.
Volume
20
Issue
8
fYear
1973
fDate
8/1/1973 12:00:00 AM
Firstpage
755
Lastpage
757
Abstract
The noise and efficiency of p+-n1 -n2 -n+and n+-p1 - p2 -p+high-low silicon IMPATT diodes have been studied as a function of doping ratio n1 /n2 or p1 /p2 . In contrast to GaAs IMPATT diodes whose efficiency can be improved with some degradation of noise performance, both the efficiency and noise of Si IMPATT diodes can be improved. As an example, for a 6-GHz silicon n+-p1 -p2 -p+IMPATT structure with a doping ratio of 10, the efficiency is 21 percent and the incremental noise as compared to a uniformly doped structure is about -6 dB. These results indicate that silicon high-low structures can compete favorably with GaAs structures in both efficiency and noise performances.
Keywords
Degradation; Doping profiles; Gallium arsenide; Ionization; Noise measurement; Schottky diodes; Semiconductor device noise; Semiconductor diodes; Signal to noise ratio; Silicon;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/T-ED.1973.17739
Filename
1477396
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