• DocumentCode
    1045806
  • Title

    Design considerations of low-noise high-efficiency silicon IMPATT diodes

  • Author

    Su, Shih-Tang ; Sze, Simon M.

  • Volume
    20
  • Issue
    8
  • fYear
    1973
  • fDate
    8/1/1973 12:00:00 AM
  • Firstpage
    755
  • Lastpage
    757
  • Abstract
    The noise and efficiency of p+-n1-n2-n+and n+-p1- p2-p+high-low silicon IMPATT diodes have been studied as a function of doping ratio n1/n2or p1/p2. In contrast to GaAs IMPATT diodes whose efficiency can be improved with some degradation of noise performance, both the efficiency and noise of Si IMPATT diodes can be improved. As an example, for a 6-GHz silicon n+-p1-p2-p+IMPATT structure with a doping ratio of 10, the efficiency is 21 percent and the incremental noise as compared to a uniformly doped structure is about -6 dB. These results indicate that silicon high-low structures can compete favorably with GaAs structures in both efficiency and noise performances.
  • Keywords
    Degradation; Doping profiles; Gallium arsenide; Ionization; Noise measurement; Schottky diodes; Semiconductor device noise; Semiconductor diodes; Signal to noise ratio; Silicon;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1973.17739
  • Filename
    1477396