Title :
Single-Event Transient Pulse Propagation in Digital CMOS
Author :
Massengill, Lloyd W. ; Tuinenga, Paul W.
Author_Institution :
Vanderbilt Univ., Nashville, TN
Abstract :
Dynamic circuit equations are used to analyze the response of CMOS inverter chains to stimuli of various forms. Using a normalized description of the CMOS inverter, the conditions under which a single-event transient pulse will propagate are derived in terms of basic technology and circuit parameters. The inverter characteristic waveform, derived in a technology-independent way, is shown to be key to unattenuated pulse propagation. The pulse broadening mechanism is shown to be predictable from CMOS device hysteretic effects, and technology-normalized values of pulse broadening are quantified.
Keywords :
CMOS digital integrated circuits; invertors; transient analysis; circuit parameter; digital CMOS inverter; hysteretic effects; pulse broadening mechanism; single-event transient pulse propagation; technology-normalized values; Attenuation; CMOS digital integrated circuits; CMOS logic circuits; CMOS technology; Circuit faults; Pulse circuits; Pulse inverters; Pulse modulation; Pulse width modulation inverters; Space vector pulse width modulation; Pulse broadening; pulse propagation; pulse stretching; single event transients; single events;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2008.2006749