Title :
Alpha-Particle, Carbon-Ion and Proton- Induced Flip-Flop Single-Event-Upsets in 65 nm Bulk Technology
Author :
Wissel, Larry ; Cannon, Ethan H. ; Heidel, David F. ; Gordon, Michael S. ; Rodbell, Kenneth P.
Author_Institution :
IBM Syst. & Technol. Group, Essex Junction, VT
Abstract :
This paper presents upset rates of flip-flops in 65 nm commercial bulk technology predicted through modeling, and compares the predictions to upset rates measured with thorium foil, 15 MeV carbon ions, and 148 MeV protons. This paper demonstrates that 15 MeV carbon ions can be used to emulate the daughter products of neutron spallation reactions.
Keywords :
alpha-particle effects; carbon; flip-flops; proton effects; radiation hardening (electronics); thorium; alpha-particle induced single-event-upsets; bulk technology; carbon ions; carbon-ion induced single-event-upsets; electron volt energy 148 MeV; electron volt energy 15 MeV; neutron spallation reactions; proton induced flip-flop single-event-upsets; size 65 nm; thorium foil; Acceleration; Clocks; Flip-flops; Inverters; Neutrons; Packaging; Paper technology; Predictive models; Protons; Single event upset; Flip-flop; single-event upset (SEU); soft error;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2008.2007299
