Title :
Origin of High Total Dose Sensitivity on the OP400 Bipolar Operational Amplifier
Author :
Bernard, Muriel F. ; Dusseau, Laurent ; Moindjie, Soilihi ; Bouchet, Thierry
Author_Institution :
Astrium GmbH, Munich
Abstract :
The OP400 bipolar operational amplifier is widely used in space applications due to its performance and its low power consumption. However experimental results exhibit high total dose sensitivity. Circuit analysis is used to understand mechanisms at play and to find appropriate worst case test methods and solutions for design application.
Keywords :
bipolar integrated circuits; low-power electronics; network analysis; operational amplifiers; OP400 bipolar operational amplifier; circuit analysis; high total dose sensitivity; low power consumption; space applications; Circuit analysis; Circuit testing; Degradation; Differential amplifiers; Energy consumption; Mirrors; Operational amplifiers; Packaging; Synthetic aperture sonar; Terrorism; Bipolar transistor; integrated circuits (ICs); slew-rate; total dose;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2008.2007300
