Title :
Synthetic Testing and Interrupting Phenomena Under Short Line Fault Conditions
Author :
Yamazaki, Seiji ; Hosokawa, Masao ; Gotoo, Tokio ; Nakanishi, Kunio ; Tomiyama, Junji
Author_Institution :
Hitachi Research Laboratory Hitachi, Ltd.
fDate :
5/1/1972 12:00:00 AM
Abstract :
This paper is a contribution to work on the problems of synthetic testing under short line fault conditions. The various factors which must be taken into account when assessing validity are discussed, and the experimental evidences to support the validity of the parallel current injection method are described. The paper also deals with the severest current range in short line fault conditions for different types of circuit breakers.
Keywords :
Capacitance; Circuit breakers; Circuit faults; Circuit testing; Frequency; Inductors; Interrupters; Laboratories; Sulfur hexafluoride; Voltage;
Journal_Title :
Power Apparatus and Systems, IEEE Transactions on
DOI :
10.1109/TPAS.1972.293406